Real-time slope mapping and defect detection in bent plates using Talbot interferometry

Abstract

We demonstrate a simple method for obtaining slope contours of bent plates using Talbot interferometry. The technique has been used to map slope contours of polymethyl methacrylate specimens of different shapes. The Talbot image of a coarse grating is projected onto a specimen such that the self-image is backreflected onto the same grating again. As a Talbot interferometer is basically a grating shearing interferometer, it results in the generation of characteristic slope maps of the specimen under test. Results of the investigation match well with other slope-mapping techniques. Validation of experimental results with theoretical predictions in the case of a cantilever beam specimen has been undertaken. Accuracy of about 4.7% with respect to theoretical predictions is obtained.