Abstract
Real-time probing of the compositional evolution of single nanoparticles during an electrochemical reaction is crucial for understanding the structure-performance relationship and rationally designing nanomaterials for desirable applications; however, it is consistently challenging to achieve high-throughput real-time tracking. Here, we present an optical imaging method, termed plasmonic scattering interferometry microscopy (PSIM), which is capable of imaging the compositional evolution of single nanoparticles during an aqueous electrochemical reaction in real time. By quantifying the plasmonic scattering interferometric pattern of nanoparticles, we establish the relationship between the pattern and composition of single nanoparticles. Using PSIM, we have successfully probed the compositional transformation dynamics of multiple individual nanoparticles during electrochemical reactions. PSIM could be used as a universal platform for exploring the compositional evolution of nanomaterials at the single-nanoparticle level and offers great potentials for addressing the extensive fundamental questions in nanoscience and nanotechnology.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
