Abstract
Optical spectrum analysis and polarization analysis are not generally related by conventional wisdom. In this paper, we show that the spectrum of a light beam can be obtained using a polarimeter, with a resolution and a speed that cannot be achieved with traditional spectrum analysis methods. We experimentally demonstrate a novel polarimeter-based optical spectrum analyzer (P-OSA) and show that the high-speed and high-resolution nature of the device enables rapid measurement of the spectrum of swept laser sources at a repetition rate of more than 100 kHz. We show the generation of a unique 3-D plot of the spectral shape of a light source as its center wavelength is swept.
Highlights
Traditional optical spectrum analyzers (OSAs) are usually realized using one of the following three methods: 1) a spatially dispersive element, such as a diffractive grating, 2) a tunable narrow-band filter, such as a Fabry-Perot (F-P) resonator or a tunable fiber Bragg grating, and 3) path-length-difference varying interferometer (Michelson or Mach-Zehnder) followed by FFT analysis [1,2,3]
We report the generation of a 3-D plot of the spectral shape of a modulated light signal as a function of center wavelength of a wavelength-scanned light source
We have proposed and experimentally demonstrated a novel polarimeter-based optical spectrum analyzer, which utilizes both the state of polarization as well as the degree of polarization information of the light source after it passes through a variable differential group delay (DGD) element
Summary
Traditional optical spectrum analyzers (OSAs) are usually realized using one of the following three methods: 1) a spatially dispersive element, such as a diffractive grating, 2) a tunable narrow-band filter, such as a Fabry-Perot (F-P) resonator or a tunable fiber Bragg grating, and 3) path-length-difference varying interferometer (Michelson or Mach-Zehnder) followed by FFT analysis [1,2,3]. The P-OSA is capable of having arbitrarily high frequency resolution, yet, with arbitrarily large spectral range, provided that the measurement speed is sufficiently fast compared with the rate of the SOP change caused by the spectral change of the light source and that the signal-to-noise ratio in P-OSA’s detection circuit is sufficiently high for accurate SOP measurement. Such a feature opens a wide door for many spectral related measurements not imaginable with conventional spectrum analysis methods. This capability enables detailed spectral characterization of a fast swept-wavelength source that cannot be obtained with other conventional methods
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
