Abstract
Directional solidification of multicrystalline silicon for photovoltaic applications is investigated by means of synchrotron X-ray imaging techniques at the European Synchrotron Radiation Facility. Our experimental device combines two complementary modes: X-ray radiography imaging giving information on the dynamical evolution of the solid/liquid interface and X-ray topography giving information on the grain structure and phenomena occurring during the solidification process such as strains and twinning. In this paper, we report on the experimental details of the developed device and on some preliminary results obtained by using both imaging techniques.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.