Abstract
Synchrotron-based Laue microdiffraction has been widely applied to characterize the local crystal structure, orientation, and defects of inhomogeneous polycrystalline solids by raster scanning them under a micro/nano focused polychromatic X-ray probe. In a typical experiment, a large number of Laue diffraction patterns are collected, requiring novel data reduction and analysis approaches, especially for researchers who do not have access to fast parallel computing capabilities. In this article, a novel approach is developed by plotting the distributions of the average recorded intensity and the average filtered intensity of the Laue patterns. Visualization of the characteristic microstructural features is realized in real time during data collection. As an example, this method is applied to image key features such as microcracks, carbides, heat affected zone, and dendrites in a laser assisted 3D printed Ni-based superalloy, at a speed much faster than data collection. Such analytical approach remains valid for a wide range of crystalline solids, and therefore extends the application range of the Laue microdiffraction technique to problems where real-time decision-making during experiment is crucial (for instance time-resolved non-reversible experiments).
Highlights
Synchrotron-based Laue microdiffraction has been widely applied to characterize the local crystal structure, orientation, and defects of inhomogeneous polycrystalline solids by raster scanning them under a micro/nano focused polychromatic X-ray probe
The intensity recorded by the detector includes two main contributions: the diffraction and fluorescence signals from the crystals irradiated by the incident polychromatic X-ray beam
It is clear that the value at a certain spot in the Recorded Intensity Map” (RIM) represents the summation of all these signals from the irradiated volume of the specimen
Summary
Synchrotron-based Laue microdiffraction has been widely applied to characterize the local crystal structure, orientation, and defects of inhomogeneous polycrystalline solids by raster scanning them under a micro/nano focused polychromatic X-ray probe. This method is applied to image key features such as microcracks, carbides, heat affected zone, and dendrites in a laser assisted 3D printed Ni-based superalloy, at a speed much faster than data collection Such analytical approach remains valid for a wide range of crystalline solids, and extends the application range of the Laue microdiffraction technique to problems where real-time decision-making during experiment is crucial (for instance time-resolved non-reversible experiments). Laue microdiffraction (μXRD) using micro-focused high-intensity polychromatic X-ray beam obtained at synchrotron facilities, has found applications in a wide range of scientific disciplines such as materials, geological, and environmental sciences These studies usually involve two-dimensional raster scanning of an area of the sample, with recording of a Laue diffraction pattern at each scanning position. We demonstrate that μXRD, combined with advanced data analysis approach, can investigate almost all the microstructures mentioned above in real time on a personal laptop as the diffraction data are collected
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