Abstract
In this work, we present a simple method to improve the spatial uniformity of two-dimensional electro-optical imaging of terahertz (THz) beams. In this system, near-field THz images are captured by fully illuminating a sample using conventional optical microscope objectives. Unfortunately, due to the linear relationship between the optical probe power and the measured THz electric field, any spatial variation in probe intensity translates directly into a variation of the recorded THz electric field. Using a single normalized background frame information map as a calibration tool prior to recording a sequence of THz images, we show a full recovery of a two-dimensional flat field for various combinations of magnification factors. Our results suggest that the implementation of dynamic intensity profile correction is a promising avenue for real-time electro-optical imaging of THz beams.
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