Abstract
AbstractThis paper presents a method for real‐time cycloduction measurement based on fast ellipse detection. The Hough transform framework is known to be effective for ellipse fitting, but most of the existing methods have a high computational cost. We therefore present a novel technique for detecting a region of the pupil by fitting an ellipse based on parallelogram. Since our method eliminates outliers due to lighting, it is possible to obtain the ellipse parameters in high accuracy. Once the ellipse parameter for pupil image is detected, we can generate a projected image of iris pattern, and then estimate a rotation angle of the cycloduction by SAD matching considering the temporal information. Our experimental results demonstrate the effectiveness and robustness of our method. © 2009 Wiley Periodicals, Inc. Electron Comm Jpn, 92(11): 9–18, 2009; Published online in Wiley InterScience (www.interscience. wiley.com). DOI 10.1002/ecj.10150
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
