Abstract
The accuracy and speed of identification of organic foreign contaminants has always been a major challenge faced by every Assembly and Test factory. The current method of analyzing this failure through FTIR (Fourier Transform Infrared (spectroscopy) analysis is a tedious and difficult process. Interpretation of the FTIR result is also complicated. Alternative method using visual analysis is subjective and inaccurate. These challenges apparently impact the through put time of analysis and the accuracy of result. The best known method described on this paper involved the creation of assembly and test materials infrared spectrum library through the use of FTIR. Improvement in the Yield and accuracy of FM (foreign material) identification, analysis TPT (through put time) and effective root cause fix were achieved using this new technique.
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