Abstract

A new methodology allowing real time observation of materials during their cooling, from the molten state to low temperature has been developed. This possibility originates from the implementation of a Rapid Scan feature on a FT-IR emissometer designed to probe materials submitted to extreme temperature conditions. Original time-resolved emissivity dependence during the phase transition are reported for the first time. The resulting out of equilibrium, dynamic, new data have been compared to the equilibrium, static, classical measurements to demonstrate the reliability of the new technique on two reference samples (Al2O3 and SiO2). The proposed method has high possibilities to be applied to different materials to enable the observation of fast structural transformations during liquid to solid phase change through the evolution of the dielectric function.

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