Abstract

Measurements of the re-emitted flux of deuterium implanted into pure and boronized graphite at temperatures between 300 K and 1500 K have been performed. The flux of deuterium, re-emitted after reaching saturation, decreases with increasing temperatures above 800–1000 K. At 1400 K, the re-emission coefficient amounts to about 60% in USB15 boronized graphite compared to about 35% in EK98 graphite. Diffusion of deuterium into deep regions of the target with different diffusion constants of the different target materials is one possible explanation of this behaviour. The CD 4 production is similar in both cases; at 800 K, 20–25% of the deuterium is re-emitted as methane.

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