Abstract
Damage accumulation in argon-irradiated SrTiO3 single crystals has been studied using a combination of Rutherford backscattering/channeling (RBS/C), high-resolution transmission electron microscopy (HRTEM) and high-resolution X-ray diffraction (HRXRD) techniques. The RBS/C spectra were fitted using McChasy, a Monte Carlo simulation code that allows for a quantitative analysis of amorphous-like and dislocation-like types of defects. The results were interpreted by using a multi-step damage accumulation model under the assumption that the damage accumulation occurs in a series of structural transformations that are triggered by lattice stress caused by formation of a free volume in the irradiated crystal. This assumption has been confirmed by HRTEM and HRXRD.
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