Rayleigh surface wave in a piezoelectric wafer with subsurface damage

Abstract

An analytical study is carried out on the propagation of Rayleigh surface waves in a piezoelectric wafer with subsurface damage. The region of subsurface damage is considered to be a functionally graded piezoelectric thin film. The findings show the influence of the gradient parameter, thickness of the region of subsurface damage, and three different types of damage on the properties of surface-wave propagation, including the phase velocity and electromechanical coupling factor. They can provide theoretical guidance in nondestructive evaluation for the analysis of the reliability and durability of electronic devices made of piezoelectric wafers.