Abstract
A technique is proposed to measure cylindrically symmetric refractive index profiles of transparent rods. A probe ray is incident to the side of the rod, and its emergent point is observed on an end surface of the rod. A simple relationship between incident and emergent ray positions is used to determine the index profile. The profile of a graded index rod lens was measured with an accuracy to within 1 part in 103. An extension of the method to a more general profile distribution is discussed.
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