Abstract
The field of optical fabrication has progressed to a point where manufacturing optical quality freeform surfaces is no longer prohibitive. However, to stimulate the development of freeform systems, optical designers must be provided with the necessary tools. Full-field displays are an example of such a tool. Identifying the field dependence of the dominant aberrations of a freeform system is critical for a controlled optimization and with the help of full-field displays, this can be accomplished. Of specific interest is coma, an often system-limiting aberration and an aberration that has recently been directly addressed with freeform surfaces. In this research, we utilize nodal aberration theory to develop a ray-based method to generate a coma full-field display that circumvents wavefront fitting errors that can affect Zernike polynomial-based full-field displays for highly aberrated freeform starting designs.
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