Abstract
We study the dependence of the charge-collection-efficiency, or CCE, on the rate of charged particles impinging on neutron-irradiated single-crystal Chemical-Vapor-Deposition (scCVD) diamond sensors. These effects are not observed in un-irradiated high quality scCVD sensors. The rate dependence appears to be associated with the build-up of an electric field opposing the applied charge-collection field in the sensor. We find that exposure of the detector to red or near-IR light reverses this effect on the CCE during operation.
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