Abstract
SUMMARYA simple and easily adaptable interface between a Vickers M86 scanning microdensitometer and microinterferometer and a Z80 CP/M based microcomputer (Zenith Z89) is described. The hardware is supplemented by a software package written in Fortran‐66, linked with an assembly routine for two‐dimensional spot control and measurement. Facilities are provided for background correction, image processing, calibration of the spot movement, correction for glare, diffraction and finite spotsize and computer‐aided focusing. Results can be plotted on a matrix printer and on a graphical unit as ruled surface plot, as isophase or isodensity contour diagram or in three‐dimensional projection with hidden line removal.
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