Abstract

Samarium and aluminium co-doped ZnO (Sm:AZO) thin films were deposited on glass substrate by nebulizer spray pyrolysis technique with different Sm doping concentrations (0at%, 0.5at%, 1at% and 1.5at%). X-ray diffraction patterns confirm the polycrystalline nature of prepared films with hexagonal crystal structure. The average crystallite size was found to be reduced with Sm doping due to increased lattice defects. The Raman spectra exhibited characteristic ZnO wurtzite structure confirmed through the presence of E2-high mode peak at 438cm−1. The surface topology analysis revealed uniformly distributed wheat shaped particles without any pinholes for 1at% Sm doped ZnO film. Sm:AZO films displayed high transparency which is around 90% and the energy gap of ~ 3.30eV. Photoluminescence spectra of the thin films showed an UV emission peak at ~ 386nm corresponds to near band edge (NBE) emission of bulk ZnO. Room temperature Hall Effect measurement showed that all the prepared films possess n-type conducting nature with low electrical resistivity (ρ) 4.31 × 10−4Ωcm for 1at% Sm doped film. High figure of merit (ф) value of ~ 11.9 × 10−3 (Ω/cm)−1 was observed which indicates that the deposited films are highly suitable for opto-electronic device applications.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call