Rapid structure determination of disordered materials: study of GeSe 2 glass

Abstract

X-ray diffraction experiments on GeSe 2 glass employing an Imaging Plate detector system have been carried out and their performance compared to that of traditional experiments employing point-type detectors. Imaging Plate detectors have been found to perform very well delivering good quality data for just a second. The analysis of the experimental data shows that the atomic ordering in GeSe 2 glass bears many of the characteristics of a random network of Ge–Se 4 tetrahedra.