Abstract
X-ray diffraction experiments on GeSe 2 glass employing an Imaging Plate detector system have been carried out and their performance compared to that of traditional experiments employing point-type detectors. Imaging Plate detectors have been found to perform very well delivering good quality data for just a second. The analysis of the experimental data shows that the atomic ordering in GeSe 2 glass bears many of the characteristics of a random network of Ge–Se 4 tetrahedra.
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