Rapid one-shot dual-shearing digital shearography using a spatial light modulator.

Abstract

Digital shearography is a non-contact, whole-field, and high-accuracy laser-based optical interferometric method. It is widely used in the field of non-destructive testing and material evaluation. Dual-shearing DS, as the state-of-the-art method, can detect defects or measure the derivative of deformation in two sensitive directions. Most existing dual-shearing DS is realized with a bulky Michelson or Mach-Zehnder interferometer; recently, the usage of a spatial light modulator (SLM) in DS offers a new approach to designing a simple and light shearographic system. However, prior proposed SLM-based DS requires multiple shots for the phase map acquisition, with the classic temporal phase-shift (TPS) technique severely limiting its applications. This paper proposes a novel, to our best knowledge, one-shot dual-shearing DS by creating a dual-stripe pattern in the SLM. Two separate phase maps, with different sensitive directions, were acquired simultaneously via the spatial phase-shift technique. The measurement can be easily done within a single shot in its compact and light body. Moreover, the shearing amount of the two sensitive directions can be set independently and precisely. These advantages promote that the proposed system can be applied in various applications, especially for dynamic and complicated composite material testing. A detailed theory and experimental validation are described.