Abstract
A simple and fast technique that allows a diagnosis of faulty elements in antenna arrays, that only needs to consider a small number of samples of its degraded far-field pattern is described. The method tabulates patterns radiated by the array with 1 faulty element only. Then, the pattern corresponding to the configuration of failed/unfailed elements under test is calculated using the error-free pattern and the patterns with 1 faulty element. The configuration with the lowest difference between the calculated and the degraded patterns is selected. Comparison of the performance of this method using an exhaustive search and a genetic algorithm for an equispaced linear array of 100 lambda/2-dipoles is shown. Mutual coupling as well as noise/measurement errors in the pattern samples were considered in the numerical analysis.
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