Abstract
An 850-nm-thick CuAlO 2 film was formed by solid state reaction of evaporated thin film Cu on c-cut Al 2O 3 (sapphire) at 1200 °C for reaction times as short as 10 min. X-ray diffractogram confirms the formation of (0 0 l) CuAlO 2, indicating oriented growth of CuAlO 2 on c-cut Al 2O 3. Fourier transformation infra-red (FTIR) spectra showed peaks corresponding to Cu–O, Al–O and O–Cu–O bonds, confirming further the CuAlO 2 phase formation. UV–visible spectrum measurement showed high transparency of the film in the visible region with a direct band gap of 3.25 eV. The mechanism of the formation of the film is discussed.
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