Abstract
Stitch defect detection is an important means to ensure the quality of stitched fabrics. In order to realize the intellectualization of the sewing process, a rapid defect detection method based on machine vision was proposed. In order to solve the problem of motion blur caused by sewing speed, an image DeblurGAN-BSV3 algorithm is proposed. Firstly, different attention fusion mechanisms are introduced to achieve accurate extraction of image features. Secondly, the depth-separable convolution of the trunk network is replaced by blueprint convolution to ensure the processing speed of the detection algorithm and the clarity of the output image. In order to solve the difficulty of rapid detection of pin defects, a student–teacher feature pyramid matching method was proposed. Firstly, the abnormal region interpretation technology was used to explicitly visualize the defect area of the identified abnormal instances, and then the abnormal detection score was performed on the detected images to make a quality judgment. The experimental results show that the combination of the above two methods has a good ability for rapid defect detection. Rapid detection of common pin defects is realized.
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