Abstract
An apparatus has been developed which permits rapid collection of X-ray powder diffraction data for structure refinement by pattern analysis. The apparatus is built on a cylindrical position-sensitive detector with an angular aperture of 120° and resolution of 0.05° in 2θ. The detector uses a metal blade as anode and works in the self-quenching streamer mode of gas ionization. A wide-angle powder pattern can be recorded simultaneously from a stationary specimen, where geometrical broadening of reflection lines is suppressed by limiting the angular width of the incident beam. A test made with standard corundum powder shows that a diffraction pattern with a substantially better resolution is obtainable in one-eightieth the time compared with a normal θ–2θ diffractometer. The usefulness of the apparatus in high-temperature work has been demonstrated in profile refinement of structural parameters for the δ phase of bismuth oxide at 1057 K.
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