Abstract
We report the application of optical frequency domain reflectometry and a discrete-layer-peeling inverse scattering algorithm to the spatial characterization of the UV induced complex coupling coefficient during fiber Bragg grating growth. The fiber grating is rapidly characterized using this technique to give irradiance dependent growth as a function of exposure time, thereby providing the complete characterization of the coupling coefficient in the form of a "growth surface," which is related to the fiber's photosensitivity. We compare measurements of fiber Bragg grating growth in SMF-28 when exposed to continuous wave 244 nm irradiation from 0 to 90 W cm(-2) for exposure times up to 3230 s with a selection of other fibers including high germanium concentration fiber and erbium doped fiber.
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