Abstract
We demonstrate a fast method to detect microscopic two-level systems in a superconducting phase qubit. By monitoring the population leak after sweeping the qubit bias flux, we are able to measure the two-level systems that are coupled with the qubit. Compared with the traditional method that detects two-level systems by energy spectroscopy, our method is faster and more sensitive. This method supplies a useful tool to investigate two-level systems in solid-state qubits.
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