Abstract
I introduce an algorithm for subpixel localization of imaged objects based on an analytic, non-iterative calculation of the best-fit radial symmetry center. This approach yields tracking accuracies that are near theoretical limits, similarly to Gaussian fitting, but with orders-of-magnitude faster execution time, lower sensitivity to nearby particles and applicability to any radially symmetric intensity distribution. I demonstrate the method with several types of data, including super-resolution microscopy images.
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