Abstract
The dependence of the coverage fraction for the random sequential adsorption of k2-mers on a two-dimensional substrate is studied when different distributions of defects introducing exclusion domains on the substrate are used. The k2-mers are deposited on a square lattice with closed boundary conditions. The different geometries and topologies of the distributions of defects include regular and random geometries, as well as different topologies defined by the concentration of defects.
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