Random pattern testing versus deterministic testing of RAMs

Abstract

The number of (random) patterns required for random testing of RAMs (random-access memories), when classical fault models including pattern-sensitive faults are considered is determined. Markov chains are a powerful tool for this purpose. Single faults are considered first, and the influence of different parameters is analyzed. Double faults are then considered and arguments are presented to extend the results to all multiple-coupling faults. Those results are compared to the optimal or best-known number of test patterns required when deterministic testing is considered, for the same fault models. >