Random energy loss and straggling study of Li into Si

Abstract

In the present work we have measured the random 7Li stopping power and range straggling into Si. With this aim we have employed the Rutherford backscattering (RBS) technique together with a multilayer Sb/Si marker. The stopping power measurements were performed in the 280–8500 keV energy interval, while the range straggling ones were done in the 380–2500 keV energy interval. The present results were compared with the TRIM predictions and the semi-empirical calculations by the Kalbitzer group, and an overall good agreement was found for both cases.