Abstract
Polycrystalline Bi4Ti3O12thin films were prepared on fused quartzsubstrates by pulsed laser deposition. The films were crystallized inthe orthorhombic layer perovskite structure confirmed by x-raydiffraction and Raman spectroscopy. The two broad Raman bands centredat 57 and 93 cm−1 at 300 K break up into clusters ofseveral sharp Raman peaks at 90 K. The temperature dependence of Ramanspectra indicates the occurrence of monoclinic distortion oforthorhombic structure at low temperature in the as-preparedBi4Ti3O12 thin films.
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