Abstract

Using Raman spectroscopy method, the attempt was made to quantify the SiO2 content in stuffed β-quartz derivative phases precipitated in lithium aluminosilicate glass-ceramics. The initial glasses were prepared by a conventional melt quenching technique, annealed and heat-treated in a temperature range of 660–850°C. The unit-cell parameters were determined by X-ray diffraction (XRD) analysis. In Raman spectra, the one-mode behavior of complex mixed crystals of a series of stuffed β-quartz derivative phases x(LiAl)(1−x)SiO2 was determined. It was demonstrated that the linear dependence of the frequency of the high-frequency Raman band with SiO2 content can be used for quantifying the SiO2 concentration in the crystalline phase with β-quartz structure. It was found that the linear dependence of the unit cell’s volume of β-quartz derivative phases on the SiO2 content can be used for quantifying the SiO2 content in the crystalline phase with β-quartz structure as well. The results obtained by both independent methods are in a good agreement.

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