Abstract

Graphene distinctive electronic and optical properties have sparked intense interest throughout the scientific community bringing innovation and progress to many sectors of academia and industry. Graphene manufacturing has rapidly evolved since its discovery in 2004. The diverse growth methods of graphene have many comparative advantages in terms of size, shape, quality and cost. Specifically, epitaxial graphene is thermally grown on a silicon carbide (SiC) substrate. This type of graphene is unique due to its coexistence with the SiC underneath which makes the process of transferring graphene layers for devices manufacturing simple and robust. Raman analysis is a sensitive technique extensively used to explore nanocarbon material properties. Indeed, this method has been widely used in graphene studies in fundamental research and application fields. We review the principal Raman scattering processes in SiC substrate and demonstrate epitaxial graphene growth. We have identified the Raman bands signature of graphene for different layers number. The method could be readily adopted to characterize structural and exceptional electrical properties for various epitaxial graphene systems. Particularly, the variation of the charge carrier concentration in epitaxial graphene of different shapes and layers number have been precisely imaged. By comparing the intensity ratio of 2D line and G line—“I2D/IG”—the density of charge across the graphene layers could be monitored. The obtained results were compared to previous electrical measurements. The substrate longitudinal optical phonon coupling “LOOPC” modes have also been examined for several epitaxial graphene layers. The LOOPC of the SiC substrate shows a precise map of the density of charge in epitaxial graphene systems for different graphene layers number. Correlations between the density of charge and particular graphene layer shape such as bubbles have been determined. All experimental probes show a high degree of consistency and efficiency. Our combined studies have revealed novel capacitor effect in diverse epitaxial graphene system. The SiC substrate self-compensates the graphene layer charge without any external doping. We have observed a new density of charge at the graphene—substrate interface. The located capacitor effects at epitaxial graphene-substrate interfaces give rise to an unexpected mini gap in graphene band structure.

Highlights

  • Graphene is a promising new material emerging from simple sp2 bonded carbon atoms arranged in honeycomb lattices

  • The obtained results agreed with earlier electrical measurements

  • A new method based on the substrates longitudinal optical phonons (LOOPC) mode has been used to establish the density of charge in epitaxial graphene for different layer shape and numbers have been junctions with topological edge and snake states could be established in the complete absence of a real, external magnetic field [150]

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Summary

Introduction

Graphene is a promising new material emerging from simple sp bonded carbon atoms arranged in honeycomb lattices. The Dirac electrons in graphene demonstrate high charge mobilities that exceed 100,000 cm2/Vs to reach maximum velocities of 5 × 107 cm−2 s−1 [29,30,31]. Notable electric field can be induced by reshaping a graphene layer to form bubbles and domes—accompanied by a complex charge redistribution. Epitaxial graphene exhibits many characteristics such as anomalous Hall effect [57], high carrier mobility and narrow dimension (an atomic layer dimension) which make it competitive and viable as a magnetic detector. We will highlight the correlation between the density of charge and the different shapes and layers number in epitaxial graphene. Our findings demonstrate that by comparing the local density of charge in epitaxial graphene to its shape and number of layers we have discovered new and unexpected capacitance effects. The result is a unique and unusual density of charge at the substrate-graphene interface

Silicon Carbide Substrate Properties Directed to Epitaxial Graphene Growth
Structural Properties of Silicon Carbide Polytypes
Si-Face Grown Epitaxial Graphene
C-Face Grown Epitaxial Graphene
SiC polarity Effect on the Grown Graphene Layers
Raman Signature of Graphene Layer
Raman Spectroscopy and Coherence to Electrical Measurements of Graphene
Graphene Raman Modes Locating Electrical Properties Changes
Electrical Properties of Single Layer Graphene
SiC Termination Impact on Landau Quantisation Localised by Raman
Landau-Phonons Level Crossings
Findings
Conclusions
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