Raman spectroscopy coupled with AFM scan head: A versatile combination for tailoring graphene oxide/reduced graphene oxide hybrid materials

Abstract

Raman spectroscopy is a typical technique used for quality control and identification of graphene oxide, able to generate a laser-induced reduction process, even at low power, during spectroscopic characterization of such systems. This phenomenon, far from being a problem, brought up novel routes to obtain hybrid carbonaceous materials for diverse applications. Motivated by this feature, the present study provides new insights into controllable patterning of graphene oxide by introducing the combined use of Raman spectroscopy with synchronized X-Y scanning using an AFM head, as lithographical approach for tailoring conducting/insulating reduced graphene oxide/graphene oxide channels pattern. Thus, a systematic study of spectral, topographical and chemical characterizations performed on laser-induced hybrid structures is presented, showing the dependence on a proper selection of laser wavelength, power, and irradiation times as well as scanning parameters to achieve the effective fabrication of microchanneled patterns with nanometric depths of interest in nanotechnology applications.