Raman spectroscopic investigation of pure and ytterbium‐doped rare earth silicate crystals

Abstract

AbstractRaman spectroscopy was used to study the molecular structure of a series of selected rare earth (RE) silicate crystals including Y2SiO5 (YSO), Lu2SiO5 (LSO), (Lu0.5Y0.5)2SiO5 (LYSO) and their ytterbium‐doped samples. Raman spectra show resolved bands below 500 cm−1 region assigned to the modes of SiO4 and oxygen vibrations. Multiple bands indicate the nonequivalence of the REO bonds and the lifting of the degeneracy of the RE ion vibration. Low intensity bands below 500 cm−1 are an indication of impurities. The (SiO4)4− tetrahedra are characterized by bands near 200 cm−1 which show a separation of the components of ν4 and ν2, in the 500–700 cm−1 region which are attributed to the distorting bending vibration and in the 880–1000 cm−1 region which are attributed to the symmetric and antisymmetric stretching vibrational modes. The majority of the bands in the 300–610 cm−1 region of Re2SiO5 were found to arise from vibrations involving both Si and RE ions, indicating that there is considerable mixing of Si displacements with SiO bending modes and REO stretching modes. The Raman spectra of RE silicate crystals were analyzed in terms of the molecular structure of the crystals, which enabled separation of the bands attributed to distinct vibrational units. Copyright © 2007 John Wiley & Sons, Ltd.