Abstract
An integrated analytical approach, which combines elemental [scanning electron microscopy with energy-dispersive X-ray spectroscopy (SEM/EDS)] and molecular (Raman) chemical imaging techniques, has been utilized for the characterization of a residual phase of gallium in mixed oxide (MOX) surrogate material. Surrogate MOX materials are comprised of CeO2 in place of PuO2. In real MOX materials, PuO2 is mixed with UO2 as a commercial fuel source. A Ga phase remains in the surrogate sample following reductive heating experiments designed to explore the removal of gallium from weapons-grade plutonium. The SEM/EDS data reveal the concentration of Ga within the grain boundaries of the sample and a distribution of Ce and O throughout the sample matrix. Molecular analysis provided by Raman chemical matrix imaging correlates with the SEM/EDS elemental imaging results. Specifically, the Raman data suggest that the matrix is comprised of CeO2 and grain boundaries are a mixed phase comprised of CeO2 with a form of Ga, most likely a CeGaO3 perovskite phase having a cubic structure.
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