Raman scattering study of photoexcited plasma in GaAsBi/GaAs heterostructures: Influence of carrier confinement on photoluminescence

Abstract

GaAsBi alloys are potential candidates for near-infrared optoelectronic applications, such as light-emitting diodes, laser diodes, avalanche photodiodes, and solar cells. In this paper, photoexcited plasma in GaAs1-xBix/GaAs (1.7 ≤ x ≤ 8.6%) heterostructures grown by molecular beam epitaxy was investigated using Raman spectroscopy. The strong LO phonon-plasmon coupled mode (LOPC) was generated by continuous-wave laser excitation at room temperature. The upper branch of the LOPC mode (L+ mode) was clearly observed for Bi contents from x = 3.9–8.6%, which indicates that photoexcited carriers with relatively good carrier mobility were confined in the GaAsBi/GaAs heterostructure. The photoexcited carrier density that was obtained by line shape analysis of the Raman spectra based on a dielectric model increased as the Bi content increased from 1.7 to 6.4%. This indicates that carrier overflow from the GaAsBi layer was suppressed because of the larger conduction band offset at the GaAsBi/GaAs heterointerface. In addition, the optical mobility calculated using the damping constant of the photoexcited L+ mode gradually decreased with increasing Bi content. This may be attributed to an increased defect density with decreasing growth temperature. Our findings provide valuable insight into the development of high-performance optoelectronic devices based on GaAsBi alloys and show the potential of Raman spectroscopy for evaluation of carrier confinement in heterostructures.