Raman scattering and X-ray diffraction of disordered CdI2

Abstract

Raman scattering and X-ray diffraction have been studied in CdI2 crystals having stacking disorder. Using a simple model which regards the disorder structure as an extremely-long-period polytype and assuming the disorder in bond Raman polarisability, the authors calculated the intensity profiles of the Raman and X-ray scattering. The calculated results explain the distinctive features of the observed intensity profiles. A consistent description of the disorder obtained from the analyses of both measurements indicates that Raman scattering as well as X-ray diffraction have potential for providing structural information about disordered-layer compounds.