Abstract
This work reports the detailed Raman scattering analysis of Cu-poor Cu(In,Ga)Se2 (CIGS) electrodeposited solar cells using different excitation wavelengths. The systematic assessment of cells fabricated with Cu-poor absorbers that were synthesized with different Cu contents has allowed identifying the existence of a quasi-resonant excitation of a Raman peak characteristic of an Ordered Vacancy Compound (OVC) secondary phase when using a 785 nm excitation wavelength. The enhanced sensitivity of the spectra measured with these conditions to the presence of the OVC phase provides with a suitable tool for the non destructive assessment on the occurrence of this Cu-poor secondary phase in the surface region of the CIGS absorbers from measurements performed on finished cells. The correlation between the Raman scattering data and the optoelectronic parameters of the devices shows the existence of an optimum OVC content range leading to devices with highest open circuit voltage and efficiency. These data provide with a clear experimental evidence on the impact of the OVC phases on the device efficiency.
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