Raman piezospectroscopic evaluation of intergrowth ferroelectric polycrystalline ceramic in biaxial bending configuration

Abstract

The piezospectroscopic (PS) effect was studied in an intergrowth bismuth layer-structure ferroelectric ceramic Bi5TiNbWO15 according to a micro-Raman spectroscopic evaluation. By using a ball-on-ring flexure configuration, a biaxial stress was generated in a Bi5TiNbWO15 plate-like specimen and in situ collected Raman spectra were acquired and analyzed under several loading conditions. As the observed spectral line contained signals arising from the whole illuminated in-depth region, the laser probe information was deconvoluted (by means of an in-depth probe response function obtained according to the defocusing method) in order to deduce biaxial PS coefficients for the three Raman bands of Bi5TiNbWO15 located at 763, 857, and 886 cm−1, respectively. The biaxial PS coefficients of these bands were derived to be −1.74±0.16, −2.51±0.16, and -2.64±0.31 cm−1/GPa, respectively, and should be referred to the c axis of the Bi5TiNbWO15 crystal.