Abstract
It is known that the microwave dielectric characteristics of ZrTiO 4 are greatly influenced by processing conditions such as the degree of Sn-modification and the cooling rate after sintering. The effects of these processing variables on the nano-structural characteristics of ZrTiO 4-based dielectrics were studied by analyzing the Raman line-shape parameters using the phonon-confinement model. It was shown that the nano-structural shape of the cation-ordered domains underwent a sequential change from thin-slab form to platelet shape, and finally to spherical shape with increasing Sn-content or cooling rate.
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