Abstract
Raman intensity profiles of folded modes in SiC polytypes have been studied both experimentally and theoretically. The folded mode is denoted by a reduced wavevector of the corresponding phonon mode in 3C-SiC. It is found that there is a simple relationship between the hexagonality of the polytype structure and the reduced wavevector of the folded mode having the maximum Raman intensity. This relationship is explained by use of Raman structure factor, which is analogous to the structure factor in x-ray diffraction. It is also confirmed experimentally for higher polytypes up to 66R.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
