Abstract
Low permittivity CaMg1-x(Mn1/2Zn1/2)xSi2O6 (x = 0-0.1) ceramics were synthesized via the solid-state reaction process for the first time. The Rietveld refinement, complex chemical bond theory and Raman spectra were introduced to analyze the effects of Mn2+/Zn2+ co-substitution to microwave dielectric properties. XRD spectra indicate the CaMg1-x(Mn1/2Zn1/2)xSi2O6 ceramics processed the pure phase of CaMgSi2O6 when x ≤ 0.02 and a small volume of secondary phase Ca2MgSi2O7 for 0.04 ≤ x ≤ 0.1. The variation of εr can be put down to average bond iconicity and Raman shift. Total lattice energy and packing fraction are main influence factor of the Q×f value. The monotonous decrease of τf is associated with total bond valence and full width at half maximum of Raman peak. Additionally, CaMg1-x(Mn1/2Zn1/2)xSi2O6 (x = 0.02) ceramics sintered at 1280 °C for 3 h exhibited excellent microwave dielectric properties of εr = 8.16, Q×f = 70187, τf = −38.48 ppm/°C.
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