Abstract
We report Raman scattering (RS) measurements at 300 K from Hg 1− x Cd x Te ( x∼0.48), which was etched for a few minutes by an Ar + beam. Features of HgTe-like transverse optical (TO 2) mode at 120±1 cm −1 and longitudinal optical (LO 2) mode at 140±1 cm −1 are identified. We identified a feature observed at 135±1 cm −1 as clustering mode, which represents the integrity of the crystal lattice. We measured the Raman scattering on a beveled surface in line-scanning manner; the results showed that ion beam induced damage extends to a depth of more than 1 μm, while the ion beam’s penetrating depth is no more than 10 nm.
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