Abstract
Different advanced techniques including Raman area mapping and Raman thermal imaging have been used to investigate various properties of large area iron oxide thin films deposited by spray pyrolysis on a large area of crystalline silicon substrates under controlled external parameters. Morphological studies reveal that the obtained films acquired the lateral faceted crystalline structure of iron oxide. Together, the Raman and SEM images confirm the presence and large area distribution of the nano crystals of Fe2O3 phase. Thermal Raman imaging reveals that the obtained iron oxide thin films are robust and thus can be used for appropriate technological applications like electromagnetic shielding.
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