Abstract
Confocal Raman spectroscopy has been applied to investigate blend polycarbonate and ZnO thin layers with different thicknesses and different content of ZnO. The admittance spectroscopy have been applied to correlation of optical and electrical properties of these layers used in electroluminescence diodes and photovoltaic cells. The I-V (DC and AC) characteristics and thermally stimulated current (TSC) have been applied to the study of the deep levels in ZnO thin films grown by sol-gel method onto Si substrates. The surface spectroscopy morphology of the samples were investigated by scanning microscopy and X ray diffraction.
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