Abstract
In this paper, we have investigated some structural properties, Raman spectra of Zn1-xMnxTe films deposited by the closed space vacuum sublimation under different growth conditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined according to shifting the relative peaks positions. Keyword: Raman spectroscopy, surface morphology, x-ray diffraction, lattice parameters, solid solution of Zn1-xMnxTe, closed space vacuum sublimation
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