Abstract
Abstract Raman scattering intensities of the NiSi Raman-active modes have been calculated with three Raman measurement configurations, which can be used for the symmetry assignment of the NiSi Raman peaks. Raman-active vibrations of the NiSi crystal have also been theoretically studied. Results show that the lattices with Ag and B2g modes vibrate only in the plane normal to the NiSi[0 1 0] direction while the lattices with B1g and B3g modes vibrate only along the NiSi[0 1 0] axis. Based on such study, the relationship between the anisotropic strain distribution in the NiSi thin film and the Raman peak shifts has been briefly discussed.
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