Abstract
A radio-frequency glow discharge ion source has been interfaced with a three-dimensional quadrupole ion trap. Data are described for ion derived from brass and multicomponent glass standards. These data indicate that the ion trap has some interesting features as a mass analyzer for ions formed in a glow discharge. MS/MS efficiencies approaching 100% for oxides and hydroxides of all metal ions studied were observed. Ions derived from the argon support gas, such as ArH{sup +}, Ar{sup 2+}, and Ar{sub 2}{sup {sm_bullet}+}, were depleted in the ion trap by rapid electron-and proton-transfer reactions to background gases in the ion trap. The mass/charge ratios of the terminal ions in the sequence of reactions fell below the lower mass limit of the ion trap and were quickly ejected. The use of mass-selective ion injection techniques permitted the analysis of components present at levels as low as a few tens of parts per million. However, chemical noise due to relatively high background pressures in the ion source precluded analysis of components of lesser abundance. 35 refs., 6 figs.
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