Abstract
The influence of substrate reflectance on the radiative intensity and flux distribution and on the apparent reflectance and transmittance of an isothermal, isotropically scattering medium has been examined by using an exponential kernel approximation to obtain a simple, closed-form, approximate solution for the governing radiative transport equation. The approximate method provides one simple algebraic expression from which the bidirectional, directional hemispherical, hemispherical directional, and hemispherical reflectances can be evaluated with reasonable accuracy (better than 20%) over a wide range of optical parameters. The intensity and flux distribution also have been investigated for both conservative and nonconservative cases.
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