Abstract

Nano-satellites, which are following the CubeSat standard have established for demanding industrial and scientific applications with critical requirements on reliability and radiation tolerance. The employment of commercial off-the-shelf components enables a state-of-the-art performance but requires extensive testing to avoid and mitigate malefunctions due to the space environment. The CubeSat mission CLIMB is representative for future missions with a complex payload, a high power budget and a harsh radiation exposure. For this reason, a comprehensive irradiation study of its on-board-computer was done. The total ionizing dose damage of 50krad was evaluated at a 60Co source. As a consequence of this test, specific components were exchanged before performing single event effect studies at the synchrotron accelerator MedAustron. A board-level test revealed that the majority of effects concern the central micro controller wherefore was followed by a component-level test. Those irradiation tests make use of a pencil beam to map the device under test, which provides additional information to localize effects - by the timestamp - at the expense of an increased irradiation time compared to a homogeneous exposure. In this paper, we summarize the major findings of the test campaign and mitigation means and present a procedure for single event effect studies at medical accelerators.

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